I'm a Senior Failure Analysis Engineer at onsemi Philippines, diagnosing semiconductor failures across image sensors, ASICs, automotive sensors, ADAS power ICs, system basis chips, and high-power LEDs.
I isolate mixed-signal faults in analog blocks and digital logic using ATPG, IC layouts, schematics, IR imaging, PEM, OBIRCh, microprobing, X-ray, SEM, SAT, and electrical evaluation. I deliver detailed 8D reports that connect test results to root causes and corrective actions.
Previously at Denso Philippines, I led ECU hardware design for electric and conventional vehicles, including Ford Reference ECU output circuits, component selection, worst-case analysis, simulation, PCB prototyping, verification, and evaluation planning. I also streamlined parameter testing and report generation through automated macros.
Across both semiconductor and automotive hardware work, I've built diagnostic methods, automation scripts, test plans, and technical Know-How documents while supporting engineers and collaborating with design teams to improve product reliability.
